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Utilizing the simultaneous AFM and Raman scanning, an apertureless near-field scanning Raman microscope was constructed with an apertureless near-field scanning Raman microscope.
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The system was constructed by utilizing metal coating of the AFM tips to produce near field Raman signal. Our preliminary data show that it is easible to collect good quality AFM and Raman images in a reasonable time frame. This system will be used to study a host of nano materials and nano devices.
More details can be found on the website of WiTec
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Raman Instrumentation |
 
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support multiple lasers, and full optical path optimization
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high-performance, fully upgradeable Raman instruments
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high sensitivity ultra-low noise CCD detector
Excitation Wave Length: 325nm, 514nm, 532nm,
Objectives: 5X, 10X, 50X, 100X( for visible laser); 10X, 40X( for UV laser)
2D Mapping Stage
More Details: Renishaw - inVia Raman microscopes
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High Pressure |
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Photoluminescence Microscopy (Olympus)
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Scanning Electron Microscope (JEOL JSM-6700F)
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The JSM-6700F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution high quality imaging of micro structures.
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Our SEM system is capable of high resolution imaging as well as high quality real time image display.The maximum size of samples is up to 8 inches in diameter.
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